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Berlin 2018 – scientific programme

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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur

KFM 7: Microstructure of thin films / TEM-based Nanoanalysis

Monday, March 12, 2018, 15:00–18:20, E 124

15:00 KFM 7.1 Scanning Transmission Helium Ion Microscopy on 1nm Thick Carbon Nanomembranes — •Daniel Emmrich, Annalena Wolff, André Beyer, and Armin Gölzhäuser
15:20 KFM 7.2 Self-assembly of organic semiconducting material at the liquid-liquid interface — •Manuel Johnson, Tim Hawly, and Rainer H. Fink
15:40 KFM 7.3 Vibrational fingerprints of lithium niobate on insulator and technological aspects for domain inversion in z-cut LiNbO3 thin films — •Peter Mackwitz, Michael Rüsing, Kai Spychala, Minglong Zhai, Hui Hu, Gerhard Berth, and Artur Zrenner
16:00 KFM 7.4 Dopant distribution and octahedral distortions at superconducting complex oxide bilayer interfacesY. Eren Suyolcu, Yi Wang, •Wilfried Sigle, Federico Baiutti, Georg Cristiani, Joachim Maier, Gennady Logvenov, and Peter A. van Aken
16:20 KFM 7.5 A study on Amorphous Silicon Films using SAXS and SANS to distinguish nano-crystals from voids. — •Eike Gericke, Armin Hoell, Jimmy Melskens, Dragomir Tatchev, Uwe Keiderling, Robert Wendt, Simone Raoux, Klaus Rademann, and Klaus Lips
  16:40 20 min. break
  17:00 KFM 7.6 The contribution has been withdrawn.
17:20 KFM 7.7 Generation of Attosecond Electron Pulse Trains for Ultrafast Transmission Electron Microscopy — •Christopher Rathje, Katharina E. Priebe, Sergey V. Yalunin, Armin Feist, Thorsten Hohage, Sascha Schäfer, and Claus Ropers
17:40 KFM 7.8 Model-based geometry reconstruction of quantum dots from TEM — •Anieza Maltsi, Thomas Koprucki, Karsten Tabelow, and Tore Niermann
18:00 KFM 7.9 Structural properties of InGaAs Quantum dots investigated by Transmission Electron Microscopy — •Laura Meißner, Tore Niermann, and Michael Lehmann
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