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MM: Fachverband Metall- und Materialphysik

MM 35: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

MM 35.1: Topical Talk

Donnerstag, 4. April 2019, 10:15–10:45, H45

Friction mechanisms revealed by scanning force and electron microscopy — •Roland Bennewitz¹, Christiane Petzold¹, Marcus Koch¹, Nicholas Chan³, SG Balakrishna¹, Philip Egberts³, Andreas Klemenz², and Michael Moseler² — ¹INM Leibniz Institute for New Materials, Saarbrücken, Germany — ²Fraunhofer Institute for Mechanics of Materials IWM, Freiburg, Germany — ³Department of Mechanical and Manufacturing Engineering, University of Calgary, Canada

Atomic force microscopy (AFM) is a well-established imaging tool in nanoscience, in some applications with atomic resolution. Beyond imaging structure on nanometer scale, force measurements by AFM also reveal molecular-scale mechanisms of friction. As an example, we will present data for the structure and friction response of graphene layers grown epitaxially on Pt(111) surfaces. In friction and wear studies, the AFM tip is not only an imaging probe but equally important part of the sliding contact. While surface wear is revealed by AFM imaging, tip wear requires electron microscopy of the tip. We will discuss results for the tribochemical wear of tips when sliding silicon against gold.