Regensburg 2019 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 35: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research
MM 35.1: Topical Talk
Donnerstag, 4. April 2019, 10:15–10:45, H45
Friction mechanisms revealed by scanning force and electron microscopy — •Roland Bennewitz1, Christiane Petzold1, Marcus Koch1, Nicholas Chan3, SG Balakrishna1, Philip Egberts3, Andreas Klemenz2, and Michael Moseler2 — 1INM Leibniz Institute for New Materials, Saarbrücken, Germany — 2Fraunhofer Institute for Mechanics of Materials IWM, Freiburg, Germany — 3Department of Mechanical and Manufacturing Engineering, University of Calgary, Canada
Atomic force microscopy (AFM) is a well-established imaging tool in nanoscience, in some applications with atomic resolution. Beyond imaging structure on nanometer scale, force measurements by AFM also reveal molecular-scale mechanisms of friction. As an example, we will present data for the structure and friction response of graphene layers grown epitaxially on Pt(111) surfaces. In friction and wear studies, the AFM tip is not only an imaging probe but equally important part of the sliding contact. While surface wear is revealed by AFM imaging, tip wear requires electron microscopy of the tip. We will discuss results for the tribochemical wear of tips when sliding silicon against gold.