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MM: Fachverband Metall- und Materialphysik

MM 6: Topical session (Symposium MM): Correlative and in-situ Microscopy in Materials Research

Montag, 1. April 2019, 11:45–13:15, H44

Advanced Characterization I

	11:45	MM 6.1	Topical Talk: Break through new materials characterization frontiers with Atom Probe Microscopy — •François Vurpillot, Benjamin Klaes, Rodrigue Larde, Stefan Parviainen, and Bertrand Radiguet
	12:15	MM 6.2	Determination of 3D electrostatic field at an electron nano-emitter — •Mingjian Wu, Alexander Tafel, Peter Hommelhoff, and Erdmann Spiecker
	12:30	MM 6.3	Cryo-atom probe tomography for in-situ diffusion measurement of H at crystal defects — •Peter Felfer
	12:45	MM 6.4	Atom Probe Tomography for Thermoelectric Materials — •Yuan Yu, Oana Cojocaru-Mirédin, and Matthias Wuttig
	13:00	MM 6.5	Magic Colloidal Clusters: 3D Investigation of Self-assembled Polystyrene Particles forming Agglomerations in Crystalline Order using X-Ray Nano- and Electron Tomography — •Silvan Englisch, Janis Wirth, Thomas Pryzbilla, Benjamin Apeleo Zubiri, Junwei Wang, Nicolas Vogel, and Erdmann Spiecker