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DS 32: Poster: Optical Analysis of Thin Films
Wednesday, March 18, 2020, 15:00–18:00, P1A
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15:00 |
DS 32.1 |
Revealing The Chemical Structures Of Silicon Nanoribbons On Ag(110) Via DFT And Raman Spectroscopy — •Alexander Ehm, Dmytro Solonenko, Jorge I. Cerda, Dietrich R. T. Zahn, and Patrick Vogt
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15:00 |
DS 32.2 |
Ultrafast pump-probe microscopy on MoSe2 — •Konrad Birkmeier, Lucas Lange, Edoardo Amarotti, and Achim Hartschuh
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15:00 |
DS 32.3 |
Transient Scattering Microscopy and Non-Linear Raman response of Single-Layer Graphene — •Lucas Lange, Veit Giegold, Richard Ciesielski, and Achim Hartschuh
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15:00 |
DS 32.4 |
Evaluation of thicknesses of polymer films on steel surfaces with spectroscopic ellipsometry — •Friedrich Bürger, Maria Sonnenberg, Lienhard Wegewitz, and Wolfgang Maus-Friedrichs
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15:00 |
DS 32.5 |
Effect of lattice strain on the surface structure of epitaxial manganite thin films — •Leonard Schüler, Jonas Wawra, Sebastian Merten, and Vasily Moshnyaga
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15:00 |
DS 32.6 |
IN-SITU INVESTIGATION OF ELECTROCHROMIC RADIATION PROCESSES IN TUNGSTEN TRIOXIDE THIN FILMS BY OPTICAL SPECTROSCOPY — •Alexander Strack, Simon Burkhardt und Peter J. Klar
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15:00 |
DS 32.7 |
Real-time pump-probe microscopy of single-shot laser thin film ablation — •Till Wachweger
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15:00 |
DS 32.8 |
Hyperspectral and Time-Resolved IR Laser Polarimetry — •Christoph Kratz, Andreas Furchner, and Karsten Hinrichs
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15:00 |
DS 32.9 |
Controlling the phase-change of Ge2Sb2Te5 via ion beam doping — •Robin Schock, Martin Hafermann, Konstantin Ruffert, and Carsten Ronning
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