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DS: Fachverband Dünne Schichten

DS 32: Poster: Optical Analysis of Thin Films

Mittwoch, 18. März 2020, 15:00–18:00, P1A

15:00 DS 32.1 Revealing The Chemical Structures Of Silicon Nanoribbons On Ag(110) Via DFT And Raman Spectroscopy — •Alexander Ehm, Dmytro Solonenko, Jorge I. Cerda, Dietrich R. T. Zahn, and Patrick Vogt
15:00 DS 32.2 Ultrafast pump-probe microscopy on MoSe2 — •Konrad Birkmeier, Lucas Lange, Edoardo Amarotti, and Achim Hartschuh
15:00 DS 32.3 Transient Scattering Microscopy and Non-Linear Raman response of Single-Layer Graphene — •Lucas Lange, Veit Giegold, Richard Ciesielski, and Achim Hartschuh
15:00 DS 32.4 Evaluation of thicknesses of polymer films on steel surfaces with spectroscopic ellipsometry — •Friedrich Bürger, Maria Sonnenberg, Lienhard Wegewitz, and Wolfgang Maus-Friedrichs
15:00 DS 32.5 Effect of lattice strain on the surface structure of epitaxial manganite thin films — •Leonard Schüler, Jonas Wawra, Sebastian Merten, and Vasily Moshnyaga
15:00 DS 32.6 IN-SITU INVESTIGATION OF ELECTROCHROMIC RADIATION PROCESSES IN TUNGSTEN TRIOXIDE THIN FILMS BY OPTICAL SPECTROSCOPY — •Alexander Strack, Simon Burkhardt und Peter J. Klar
15:00 DS 32.7 Real-time pump-probe microscopy of single-shot laser thin film ablation — •Till Wachweger
15:00 DS 32.8 Hyperspectral and Time-Resolved IR Laser Polarimetry — •Christoph Kratz, Andreas Furchner, and Karsten Hinrichs
15:00 DS 32.9 Controlling the phase-change of Ge2Sb2Te5 via ion beam doping — •Robin Schock, Martin Hafermann, Konstantin Ruffert, and Carsten Ronning
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DPG-Physik > DPG-Verhandlungen > 2020 > Dresden