Dresden 2020 – wissenschaftliches Programm
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KFM: Fachverband Kristalline Festkörper und deren Mikrostruktur
KFM 14: TEM-based Nanoanalysis and Microstructure of thin films (joint session KFM/CPP)
KFM 14.6: Vortrag
Donnerstag, 19. März 2020, 16:00–16:20, HSZ 301
Characterizing self-assembled nanostructures in a hierarchical-structured film by coherent two-dimensional microscopy — •Donghai Li1, Evgenii Titov1, Maximilian Roedel2, Verena Kolb2, Sebastian Goetz1, Roland Mitric1, Jens Pflaum2,3, and Tobias Brixner1 — 1Institut für Physikalische und Theoretische Chemie, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany — 2Lehrstuhl für Experimentelle Physik VI, Universität Würzburg, Am Hubland, 97074 Würzburg, Germany — 3Bavarian Center for Applied Energy Research e.V. (ZAE Bayern), Magdalene-Schoch-Str. 3, 97074 Würzburg, Germany
Self-assembled nanostructures facilitate the development of functional materials with widely tunable properties. Hierarchical architectures consist of nanoscale building blocks spatially modulated by microscale patterns. Despite its relevance for applications and devices, characterization is demanding with existing methods because typically the local molecular-scale assembly pattern within the nanostructure cannot be resolved. Here, we determine nanostructure morphology in a hierarchically structured organic film using coherent two-dimensional (2D) micro-spectroscopy in combination with theoretical modelling of excitonic spectra. We obtain local 2D spectra with diffraction-limited spatial resolution of 260 nm. Using first principles calculations of exciton spectra for model aggregates we connect the experimentally observed signal to the characteristic lengthscale of the nanocrystallites. Thus we obtain a spatial map of nanoscale self-assembly size and confirm it to be correlated with the local slope of the microstructured film surface.