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SMuK 2023 – wissenschaftliches Programm

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T: Fachverband Teilchenphysik

T 21: Si-Strips/CMS, Pixel/Sensor

T 21.1: Vortrag

Montag, 20. März 2023, 16:30–16:45, WIL/C307

Stress testing optical readout components for CMS 2S modulesMax Beckers2, •Christian Dziwok2, Lutz Feld1, Katja Klein1, Alexander Pauls1, Oliver Pooth2, Nicolas Röwert1, Martin Lipinski1, Vanessa Oppenländer1, Felix Thurn1, and Tim Ziemons21I. Physikalisches Institut B, RWTH Aachen University, D-52056 Aachen — 2III. Physikalisches Institut B, RWTH Aachen University

New detector modules will be installed for the upcoming CMS Phase-2 Outer Tracker upgrade. There are two general types of modules, one consisting of two co-planar silicon strip sensors (2S) and one of a macro pixel and a strip sensor (PS). The communication and the auxiliary support are supplied by a so-called SErvice Hybrid (SEH) in the case of a 2S module. It houses a two-stage DC-DC converter and a Low-Power Gigabit Transceiver (lpGBT). At the RWTH Aachen University, the SEHs are qualified regarding power and communication stability in a so-called test board setup, where the SEHs will undergo additional thermal cycling while being tested. A Field-Programmable Gate Array (FPGA) firmware was developed for the integrated testing routines, like a Bit Error Rate Testing (BERT) of the lpGBT's connections. This talk will focus on the data tests of this setup.

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