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MM: Fachverband Metall- und Materialphysik
MM 6: Interface Controlled Properties, Nanomaterials and Microstructure Design I
MM 6.5: Talk
Monday, March 18, 2024, 11:15–11:30, C 230
Insights into Microstructure Evolution through Continuum Modeling of Disconnection-Mediated Interface Migration — Marco Salvalaglio1, Caihao Qiu2, Jian Han2, David Srolovitz3, and •Lucas Benoit-Maréchal1 — 1Institute of Scientific Computing, TU Dresden, 01062 Dresden, Germany — 2Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, China — 3Department of Mechanical Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong SAR, China
Interface migration in microstructures is mediated by the motion of line defects with step and dislocation character, i.e., disconnections. We illustrate a continuum model for arbitrarily curved grain boundaries or heterophase interfaces accounting for disconnections' role in the usual phenomenology of microstructure evolution. We discuss recent model advancements and applications. These include accounting for multi-mode disconnections, namely different step heights for disconnections nucleating on a given grain boundary, and phase field modeling. Numerical results are shown to reproduce molecular dynamics simulations. Implications for interface faceting and change in relative orientations of grains are discussed. Refs: Acta Materialia 227, 117178, (2022); Acta Materialia 227, 117463, (2022); Acta Materialia 251, 118880 (2023).
Keywords: Disconnections; Grain boundaries; Plasticity; Microstructures