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MM: Fachverband Metall- und Materialphysik

MM 6: Interface Controlled Properties, Nanomaterials and Microstructure Design I

MM 6.5: Vortrag

Montag, 18. März 2024, 11:15–11:30, C 230

Insights into Microstructure Evolution through Continuum Modeling of Disconnection-Mediated Interface Migration — Marco Salvalaglio¹, Caihao Qiu², Jian Han², David Srolovitz³, and •Lucas Benoit-Maréchal¹ — ¹Institute of Scientific Computing, TU Dresden, 01062 Dresden, Germany — ²Department of Materials Science and Engineering, City University of Hong Kong, Hong Kong SAR, China — ³Department of Mechanical Engineering, The University of Hong Kong, Pokfulam Road, Hong Kong SAR, China

Interface migration in microstructures is mediated by the motion of line defects with step and dislocation character, i.e., disconnections. We illustrate a continuum model for arbitrarily curved grain boundaries or heterophase interfaces accounting for disconnections' role in the usual phenomenology of microstructure evolution. We discuss recent model advancements and applications. These include accounting for multi-mode disconnections, namely different step heights for disconnections nucleating on a given grain boundary, and phase field modeling. Numerical results are shown to reproduce molecular dynamics simulations. Implications for interface faceting and change in relative orientations of grains are discussed. Refs: Acta Materialia 227, 117178, (2022); Acta Materialia 227, 117463, (2022); Acta Materialia 251, 118880 (2023).

Keywords: Disconnections; Grain boundaries; Plasticity; Microstructures