Parts | Days | Selection | Search | Downloads | Help
DS: Fachverband Dünne Schichten
DS 14: Thin Film Analytics III
DS 14.5: Talk
Tuesday, March 27, 2007, 17:45–18:00, H34
Characterization of GdScO3 layers by Spectroscopic Ellipsometry — Martin Roeckerath, •Jürgen Moers, Jürgen Schubert, and Siegfried Mantl — Institut of Bio- und Nanosystems, Forschungszentrum Jülich, D-52425 Jülich
This contribution has been appended to session DS 26.